Materials Characterization and Imaging Facility

The Materials Characterization and Imaging Facility (MatCI, formerly OMM ) offers a broad range of characterization and sample preparation equipment for use by internal as well as external users to Northwestern University.  Characterization techniques include optical microscopy, thermal imaging, thermal analysis (DSC, TGA), hardness testing (Vicker’s, Knoop, Rockwell), electronic characterization (Hall Effect, Impedance Spectroscopy, Kelvin Probe, Charge Transport) and rheological characterization.  Sample and surface preparation capabilities include mounting (castable mounts, hot pressure mounting, vacuum impregnation), cutting, sectioning and wafer dicing, polishing/grinding, electropolishing, ion beam milling and cross-sectional polishing.  Tube and box furnaces are available with temperature range up to 1700C for thermal processing.

 For more information about this facility, click here.

Equipment / Supplies

Anton Paar Modular Compact Rheometer
Manufacturer & Model:
Anton Paar MCR 302
Struers Duramin 5 Microhardness Tester
Manufacturer & Model:
Struers Duramin 5
Optotherm Micro Thermal Imaging System
Manufacturer & Model:
Optotherm Micro
Mettler Toledo TGA/SDTA851e
Manufacturer & Model:
Mettler Toledo TGA/SDTA851e
Mettler Toledo DSC822e
Manufacturer & Model:
Mettler Toledo DSC822e
Ecopia Hall Measurement System (HMS 3000)
Manufacturer & Model:
Ecopia HMS 3000
Buehler EcoMet 250/AutoMet 250 Grinder/Polisher
Manufacturer & Model:
Buehler EcoMet 250/AutoMet 250
Buehler Ecomet 250 Grinder/Polisher
Manufacturer & Model:
Buehler EcoMet 250
Struers Accutom 5 Precision Saw
Manufacturer & Model:
Struers Accutom 5
Tech Cut 5 Saw
Manufacturer & Model:
Allied High Tech Tech Cut 5
Leica TIC3X Triple Beam Ion Miller
Manufacturer & Model:
Leica Microsystems EM TIC3X
TA Instruments RSA-G2 DMA
Manufacturer & Model:
TA Instruments RSA-G2
Thorlabs Ganymede OCT System
Manufacturer & Model:
Thorlabs Ganymede 220C1

Staff

Materials Characterization and Imaging Facility Web Contact Form

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